Scaling Accuracy Analysis of Substrate SPICE Model for RF MOSFETs

A Scalable Model of the Substrate Network in Deep n-Well RF MOSFETs with Multiple Fingers

A novel scalable model of substrate components for deep n-well (DNW) RF MOSFETs with different number of fingers is presented for the first time. The test structure developed in [1] is employed to directly access the characteristics of the substrate to extract the different substrate components. A methodology is developed to directly extract the parameters for the substrate network from the mea...

Spice Compatible Model for Multiple Coupled Nonuniform Transmission Lines Application in Transient Analysis of VLSI Circuits

An SPICE compatible model for multiple coupled nonuniform lossless transmission lines (TL's) is presented. The method of the modeling is based on the steplines approximation of the nonuniform TLs and quasi-TEM assumptions. Using steplines approximation the system of coupled nonuniform TLs is subdivided into arbitrary large number of coupled uniform lines (steplines) with different characteristi...

Scaling Of Si MOSFETs For Digital Applications

analysis of ruin probability for insurance companies using markov chain

در این پایان نامه نشان داده ایم که چگونه می توان مدل ریسک بیمه ای اسپیرر اندرسون را به کمک زنجیره های مارکوف تعریف کرد. سپس به کمک روش های آنالیز ماتریسی احتمال برشکستگی ، میزان مازاد در هنگام برشکستگی و میزان کسری بودجه در زمان وقوع برشکستگی را محاسبه کرده ایم. هدف ما در این پایان نامه بسیار محاسباتی و کاربردی تر از روش های است که در گذشته برای محاسبه این احتمال ارائه شده است. در ابتدا ما نشا...

RF Noise Models of MOSFETs- A Review

A thorough study of high frequency MOSFET noise compact modeling with emphasis on channel thermal noise modeling is presented. Although the modeling of MOSFET noise dates back to many years ago, the enhanced noise generated in short channel MOSFETs has made researchers revisit the problem to develop better models, especially in recent years. In this review, a detailed discussion of the most rec...